Standardless atom counting in scanning transmission electron microscopy.
نویسندگان
چکیده
We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.
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ورودعنوان ژورنال:
- Nano letters
دوره 10 11 شماره
صفحات -
تاریخ انتشار 2010